Further I would like to acknowledge the following persons involved in post growth characterization of our samples: Lei Wang (Electrical Measurements), Jane (Auger Depth Profiling), Linda K. Sauer (X-Ray), Greg D. Haugstad (RBS), Raul A. Caretta (Auger Depth Profiling, SIMS), and Christian Wetzel of the Lawrence Berkeley Laboratory (PL).
Special thanks go to the electrical engineering machine shop staff, especially Foreman John M. Machetti and John Yonkel, for their excellent work on the manufacturing of the jet prototypes, the sample holders, and all other machining necessary for the project. Special thanks also go to Susan L. Koelfgen at the office of the Dept. of Electrical Engineering for the quick and efficient handling of paperwork related to the project.
This work was supported by the Office of Naval Research, Air Force Office of Scientific Research, and the National Science Foundation.
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